Influence of charge flow along a semiconductor surface on the nature of the multiplication coefficient in a silicon-wide-gap layer structure

Author: Sadygov Z.   Jejer T.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.23, Iss.4, 1997-04, pp. : 324-325

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