Author: Shabanov V. Shengurov D.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7850
Source: Technical Physics Letters, Vol.24, Iss.5, 1998-05, pp. : 377-378
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Temperature dependence of resistivity in polycrystalline manganites
EPL (EUROPHYSICS LETTERS), Vol. 63, Iss. 3, 2003-08 ,pp. :
Transient Photo Conductivity Decay Study on Polycrystalline Silicon
Journal de Physique III, Vol. 6, Iss. 12, 1996-12 ,pp. :
Polycrystalline Silicon Characteristics Dependence on Starting Amorphous Material
Le Journal de Physique IV, Vol. 05, Iss. C5, 1995-06 ,pp. :