Measurement of the thermal and electronic parameters of semiconductors by the “mirage-effect” method with pulsed excitation and splitting of the probe beam

Author： Petrovskii A.   Lapshin K.   Zuev V.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.24, Iss.9, 1998-09, pp. : 692-693

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