Nondestructive diagnostics of microchannel (Macroporous) silicon by X-ray topography

Author: Astrova E.   Remenyuk A.   Tkachenko A.   Shul’pina I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.26, Iss.12, 2000-12, pp. : 1087-1090

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