Electric field affects the charge state in ion-implanted Si-SiO2 structures

Author: Baraban A.   Miloglyadova L.   Ter-Nersesyants V.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.27, Iss.2, 2001-02, pp. : 129-131

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