A Novel Atomic Force Microscope with High Stability and Scan Speed

Author： He Yulin Zhang Dongxian Zhang Haijun

ISSN： 1073-9149

Source： Instrumentation Science & Technology, Vol.34, Iss.5, 2006-10, pp. : 547-554

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Infrared Spectroscopy with an Atomic Force Microscope

By Anderson Mark S.

Applied Spectroscopy, Vol. 54, Iss. 3, 2000-03 ,pp. : 349-352

Society for Applied Spectroscopy

Access to resources Recommend Favorite

A Review on Resistive Switching in High-k Dielectrics: A Nanoscale Point of View Using Conductive Atomic Force Microscope

By Lanza Mario

Materials, Vol. 7, Iss. 3, 2014-03 ,pp. : 2155-2182

MDPI

Access to resources Recommend Favorite

Nanopatterning of Si(111) surfaces by atomic force microscope scratching of an organic monolayer

By Zhang Y. Balaur E. Maupai S. Djenizian T. Boukherroub R. Schmuki P.

Electrochemistry Communications, Vol. 5, Iss. 4, 2003-04 ,pp. : 337-340

Elsevier

Access to resources Recommend Favorite

Examination of Coked Surfaces of Pillared Rectorite Catalysts with the Atomic Force Microscope

By Occelli M.L. Gould S.A.C.

Journal of Catalysis, Vol. 198, Iss. 1, 2001-02 ,pp. : 41-46

Academic Press

Access to resources Recommend Favorite

Atomic Force Microscope Imaging of the Aggregation of Mouse Immunoglobulin G Molecules

By Cai Jiye Chen Yao Xu Qingcai Chen Yong Zhao Tao Wang Xiaoyan Xia Ke

Molecules, Vol. 8, Iss. 1, 2003-01 ,pp. : 86-91

MDPI

Access to resources Recommend Favorite