Author: He Xuefeng Shang Zhengguo Cheng Yaoqing Zhu You
Publisher: IOP Publishing
ISSN: 0960-1317
Source: Journal of Micromechanics and Microengineering, Vol.23, Iss.12, 2013-12, pp. : 125009-125016
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
By Lu Yingxian Wang Xiaohong Wu Xiaoming Qin Jin Lu Ruochen
Journal of Micromechanics and Microengineering, Vol. 24, Iss. 6, 2014-06 ,pp. :
By Kachanov V. Sokolov I. Konov M. Timofeev D. Sinitsyn A.
Russian Journal of Nondestructive Testing, Vol. 46, Iss. 9, 2010-09 ,pp. :
By DOGHECHE K. CAVALLIER B. DELOBELLE P. HIRSINGER L. CATTAN E. RÈMIENS D. MARZENCKI M. CHARLOT B. BASROUR S. BALLANDRAS S.
Integrated Ferroelectrics, Vol. 80, Iss. 1, 2006-11 ,pp. :