Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C—SiC

Author： Chong-Chong Dai   Xue-Chao Liu   Tian-Yu Zhou   Shi-Yi Zhuo   Biao Shi   Er-Wei Shi  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.6, 2014-06, pp. : 66803-66807

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