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Author: Xiaodong Tong Hao Wu Qingqing Liang Huicai Zhong Huilong Zhu Chao Zhao Tianchun Ye
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.1, 2014-01, pp. : 14006-14010
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