A 130 nm radiation hardened flip—flop with an annular gate and a C-element

Author： Lei Wang   Jianhua Jiang   Yiming Xiang   Yumei Zhou  

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.35, Iss.1, 2014-01, pp. : 15010-15014

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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