Correlation between dark current RTS noise and defects for AlGaInP multiple-quantum-well laser diode

Author: Yu'an Liu   Wenlang Lou  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.2, 2014-02, pp. : 24009-24013

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next