Comparison of Dynamic Simulations with RBS Measurements of Low Energy Ion Implantation of Sb+ into SiO2/Si Substrates

Author: Ignatova Velislava A.   Wätjen Vwe   Katardjiev Illia V.   Chakarov Ivan R.  

Publisher: Springer Publishing Company

ISSN: 0026-3672

Source: Microchimica Acta, Vol.145, Iss.1-4, 2004-04, pp. : 67-74

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