Atomic Level Characterization Based on Focus Modulation Electron Microscopy

Author： Takai Yoshizo   Taya Masaki   Chikada Hidekazu   Kimura Yoshihide  

Publisher： Springer Publishing Company

ISSN： 0026-3672

Source： Microchimica Acta, Vol.155, Iss.1-2, 2006-09, pp. : 11-17

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