Non-destructive depth profile analysis using synchrotron radiation excited XPS

Author： Zier Michael   Oswald Steffen   Reiche Rainer   Wetzig Klaus  

Publisher： Springer Publishing Company

ISSN： 0026-3672

Source： Microchimica Acta, Vol.156, Iss.1-2, 2006-11, pp. : 99-101

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