Defined PEG smears as an alternative approach to enhance the search for crystallization conditions and crystal‐quality improvement in reduced screens
Publisher： John Wiley & Sons Inc
E-ISSN： 1399-0047|71|8|1627-1639
ISSN： 0907-4449
Source： ACTA CRYSTALLOGRAPHICA SECTION D (ELECTRONIC), Vol.71, Iss.8, 2015-08, pp. : 1627-1639
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