Mapping of minority carrier diffusion length and heavy metal contamination with ultimate surface photovoltage method

Author： Lagowski J.   Aleynikov A.   Savtchouk A.   Edelman P.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|503-506

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 503-506

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