Defect mapping in full-size multi-crystalline Si wafers

Author: Ostapenko S.   Romero M.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|55-58

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 55-58

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract