Author: Nakamura S. Ikeda H. Watanabe D. Suhara M. Okumura T.
Publisher: Edp Sciences
E-ISSN: 1286-0050|27|1-3|487-489
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 487-489
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Scanning room temperature photoluminescence in SiN
By Tarasov I. Dybiec M. Ostapenko S. Rohatgi A. Yelundur V. Gabor A. M.
EPJ Applied Physics (The), Vol. 27, Iss. 1-3, 2010-03 ,pp. :
Microscopic C-V measurements of SOI wafers by scanning capacitance microscopy
By Ishida T. Yoshida H. Kishino S.
EPJ Applied Physics (The), Vol. 27, Iss. 1-3, 2010-03 ,pp. :