Thermal characterisation of AlGaN/GaN HEMTs grown on silicon and sapphire substrates based on pulsed I-V measurements

Author: Aubry R.   Jacquet J.-C.   Dessertenne B.   Chartier E.   Adam D.   Cordier Y.   Semond F.   Massies J.   DiForte-Poisson M.-A.   Romann A.   Delage S. L.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|22|2|77-82

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.22, Iss.2, 2003-05, pp. : 77-82

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