Influence of the atmospheric humidity on the behaviour of silicon AFM probes in photon scanning tunneling microscopy*

Author： Benfedda M.   Lahimer S.   Bonnafe J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|4|2|213-217

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.4, Iss.2, 2010-03, pp. : 213-217

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Scanning Tunneling Microscopy Studies of Topological Insulators Grown by Molecular Beam Epitaxy

By  

EPJ Web of Conference, Vol. 23, Iss. issue, 2012-03 ,pp. : 00020-00020

Edp Sciences

Access to resources Recommend Favorite

Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon*

By Vève-Fossati C.   Martinuzzi S.  

EPJ Applied Physics (The), Vol. 3, Iss. 2, 2010-03 ,pp. : 123-126

Edp Sciences

Access to resources Recommend Favorite

Scanning proximal microscopy study of the thin layers of silicon carbide-aluminum nitride solid solution manufactured by fast sublimation epitaxy

By  

EPJ Web of Conference, Vol. 48, Iss. issue, 2013-04 ,pp. : 00002-00002

Edp Sciences

Access to resources Recommend Favorite

Reactions of Earthworms to Temperature and Atmospheric Humidity

By  

Ecology, Vol. 5, Iss. 3, 1924-07 ,pp. : 276-282

John Wiley & Sons Inc

Access to resources Recommend Favorite

Photon interactions for electron microscopy applications

By Howie A.  

EPJ Applied Physics (The), Vol. 54, Iss. 3, 2011-06 ,pp. : 33502-33502

Edp Sciences

Access to resources Recommend Favorite