Ebic contrast in a polycrystalline semiconductor: Grain size dependence*

Author: Talai M. C.   Mekki D. E.   Tarento R. J.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|8|1|1-5

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.8, Iss.1, 2010-03, pp. : 1-5

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Abstract