Full characterization at 904 nm of large area Si p-n junction photodetectors produced by LID technique

Author: Ismail R. A.   Abdulrazaq O. A.   Hadi A. A.   Hamadi O. A.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|38|3|197-201

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.38, Iss.3, 2007-01, pp. : 197-201

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Abstract