Author: Wurtz G. Bachelot R. Royer P.
Publisher: Edp Sciences
E-ISSN: 1286-0050|5|3|269-275
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.5, Iss.3, 2010-03, pp. : 269-275
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Looking at the nanoscale: scanning near-field optical microscopy
By De Serio M. Zenobi R. Deckert V.
TrAC Trends in Analytical Chemistry, Vol. 22, Iss. 2, 2003-02 ,pp. :
By Bijeon J.-L. Adam P.-M. Barchiesi D. Royer P.
EPJ Applied Physics (The), Vol. 26, Iss. 1, 2004-03 ,pp. :
By Ducourtieux S. Grésillon S. Rivoal J. C. Vannier C. Bainier C. Courjon D. Cory H.
EPJ Applied Physics (The), Vol. 26, Iss. 1, 2004-03 ,pp. :