Low temperature semi-quantitative analysis of local electrical field in silicon diode by transmission electron microscopy

Author： Cabanel C.   Brouri D.   Laval J. Y.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|34|2|107-116

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.34, Iss.2, 2006-05, pp. : 107-116

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