Author: Meyer Th. Schmidt M. Engelhardt F. Parisi J. Rau U.
Publisher: Edp Sciences
E-ISSN: 1286-0050|8|1|43-52
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.8, Iss.1, 2010-03, pp. : 43-52
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Abstract