A virtual non contact-atomic force microscope (NC-AFM): Simulation and comparison with analyticalmodels

Author: Couturier G.   Aimé J. P.   Salardenne J.   Boisgard R.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|15|2|141-147

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.15, Iss.2, 2010-03, pp. : 141-147

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Abstract