Annealing ambient controlled deep defect formation in InP

Author： Zhao Y. W.   Dong Z. Y.   Duan M. L.   Sun W. R.   Zeng Y. P.   Sun N. F.   Sun T. N.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|167-169

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 167-169

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