Raman scattering characterization of residual strain and alloy composition in bulk Si1−xGex crystal

Author： Islam M. R.   Yamada M.   Abrosimov N. V.   Kiyama M.   Tatsumi M.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|325-328

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 325-328

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