Perturbing effects of the probe support on the calibration of electric field meters

Author: Bottauscio O.   Chiampi M.   Crotti G.   Zilberti L.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|42|3|345-350

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.42, Iss.3, 2008-04, pp. : 345-350

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Abstract