Author: Bottauscio O. Chiampi M. Crotti G. Zilberti L.
Publisher: Edp Sciences
E-ISSN: 1286-0050|42|3|345-350
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.42, Iss.3, 2008-04, pp. : 345-350
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Calibration setup with metrological support for space qualified electric field probe
MATEC Web of conference, Vol. 158, Iss. issue, 2018-03 ,pp. :