Study of the defects in oxygen implanted silicon subjected to neutron irradiation and high pressure annealing

Author: Jung W.   Kaniewska M.   Misiuk A.   Londos C. A.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|115-118

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 115-118

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Abstract