Strain effects of InP/Si and InP/porous Si studied by spectroscopic ellipsometry

Author: Lajnef M.   Ben Sedrine N.   Harmand J. C.   Travers L.   Ezzaouia H.   Chtourou R.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|42|2|99-102

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.42, Iss.2, 2008-03, pp. : 99-102

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Abstract