Measurement of the probe impact force of the atomic force microscope operating in the amplitude modulation mode

Author： Shcherbin B.   Ankudinov A.   Kiyuts A.   Loboda O.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7834

Source： Physics of the Solid State, Vol.56, Iss.3, 2014-03, pp. : 531-537

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

A Novel Atomic Force Microscope with Multi-Mode Scanner

By  

Journal of Physics: Conference Series , Vol. 680, Iss. 1, 2016-01 ,pp. : 43-46

IOP Publishing

Access to resources Recommend Favorite

Atomic force microscope in a contactless mode: Peculiarities of force interactions

By Rekhviashvili S.  

Technical Physics Letters, Vol. 26, Iss. 6, 2000-06 ,pp. : 517-519

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

On the operating stability of a scanning force microscope with a nanowhisker at the top of the probe

By Levichev V.   Zhukov M.   Mukhin I.   Denisyuk A.   Golubok A.  

Technical Physics, Vol. 58, Iss. 7, 2013-07 ,pp. : 1043-1047

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope

By Shih Po-Jen  

Sensors, Vol. 12, Iss. 5, 2012-05 ,pp. : 6666-6684

MDPI

Access to resources Recommend Favorite

Nanolithography with an atomic force microscope

By Wendel M.   Irmer B.   Cortes J.   Kaiser R.   Lorenz H.   Kotthaus J.P.   Lorke A.   Williams E.  

Superlattices and Microstructures, Vol. 20, Iss. 3, 1996-10 ,pp. : 349-356

Academic Press

Access to resources Recommend Favorite