Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope

Author: Shih Po-Jen  

Publisher: MDPI

E-ISSN: 1424-8220|12|5|6666-6684

ISSN: 1424-8220

Source: Sensors, Vol.12, Iss.5, 2012-05, pp. : 6666-6684

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Abstract