Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

Author： Nečas D   Ohlídal I   Franta D   Ohlídal M   Vodák J  

Publisher： IOP Publishing

E-ISSN： 2040-8986|18|1|15401-15410

ISSN： 2040-8986

Source： Journal of Optics, Vol.18, Iss.1, 2016-01, pp. : 15401-15410

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