Qualitative evaluation of active potential barriers in SnO2-based polycrystalline devices by electrostatic force microscopy

Author： Marques V.P.B.   Cilense M.   Bueno P.R.   Orlandi M.O.   Varela J.A.   Longo E.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.87, Iss.4, 2007-06, pp. : 793-796

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