Atomic Force Microscopy Simulation by MD/Continuum Coupling Method

Author： Senda Yasuhiro   Imahashi Nobuyuki   Shimamura Shuji   Blomqvist Janne   Nieminen Risto  

Publisher： Taylor & Francis Ltd

ISSN： 1058-4587

Source： Integrated Ferroelectrics, Vol.155, Iss.1, 2014-07, pp. : 33-38

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