X-ray photoelectron spectroscopy study and humidity sensing properties of Zn doped SnO₂ thin films

By Tripathi Akhilesh   Mishra Sheo   Pandey Akhilesh   Shukla R.  

Journal of Materials Science: Materials in Electronics, Vol. 24, Iss. 12, 2013-12 ,pp. : 4951-4957

Springer Publishing Company

Access to resources Recommend Favorite

Study of Carbon Thin Film Deposition on Various Buffer Layer as Characterized by X-Ray Diffraction and Raman Spectroscopy

By  

Advanced Materials Research, Vol. 2015, Iss. 1112, 2015-08 ,pp. : 106-109

Trans Tech Publications

Access to resources Recommend Favorite

X-ray photoelectron spectroscopy characterization of the interface between Ag electrode and PVDF film treated by electric poling

By Ye Yun   Jiang Yadong   Yu Junsheng   Wu Zhiming   Zeng Hongjuan  

Journal of Materials Science: Materials in Electronics, Vol. 17, Iss. 12, 2006-12 ,pp. : 1005-1009

Springer Publishing Company

Access to resources Recommend Favorite

Surface properties of electrodeposited a-Si : C : H : F thin films by X-ray photoelectron spectroscopy

By Ram P.   Singh J.   Ramamohan T.R.   Venkatachalam S.   Sundarsingh V.P.  

Journal of Materials Science, Vol. 32, Iss. 23, 1997-12 ,pp. : 6305-6310

Springer Publishing Company

Access to resources Recommend Favorite

Interactions of thin films of Pd and Pd/Si on GaAs: an X-ray photoelectron spectroscopic study combined with a thermodynamic analysis

By Iwakuro H.   Kuroda T.   Shen D.H.   Yagi H.  

Journal of Materials Science, Vol. 33, Iss. 2, 1998-02 ,pp. : 379-384

Springer Publishing Company

Access to resources Recommend Favorite