Raman investigation of defective SiC nanocrystals

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-4555|46|12|1225-1229

ISSN: 0377-0486

Source: JOURNAL OF RAMAN SPECTROSCOPY, Vol.46, Iss.12, 2015-12, pp. : 1225-1229

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Abstract