A novel diode string triggered gated-PiN junction device for electrostatic discharge protection in 65-nm CMOS technology

Author： Li-Zhong Zhang Yuan Wang Guang-Yi Lu Jian Cao Xing Zhang

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|10|108503-108507

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.10, 2015-10, pp. : 108503-108507

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