Atomistic aspects of carrier concentration variation in post-annealed indium tin oxide films

Author： Kim Ji-Woong   Kim Hyegyeong   Lee Min-Young   Lee Doo-Yong   Lee Ji-Sung   Bae Jong-Seong   Lee Jeong-Soo   Park Sungkyun   Kim Ji-Woong  

Publisher： IOP Publishing

E-ISSN： 1361-6463|48|39|395307-395312

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.48, Iss.39, 2015-10, pp. : 395307-395312

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