Novel approaches to study low-energy electron-induced damage to DNA oligonucleotides

Publisher: IOP Publishing

E-ISSN: 1742-6596|635|6|1-1

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.635, Iss.6, 2015-09, pp. : 1-1

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next