Author： François M.
Publisher： Edp Sciences
E-ISSN： 1156-3141|100|12|1137-1149
ISSN： 0035-1563
Source： Revue de Métallurgie, Vol.100, Iss.12, 2010-03, pp. : 1137-1149
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
In the present paper, a synthesis of the relations between diffraction stress analysis and multiscale modelling is presented. It is found that, although models give good qualitative and quantitative results in the elastic field, the extension to internal stresses of elastic-plastic origin remains semi-quantitative and many studies are still required to obtain a consistent formulation between diffraction and modelling.
Related content
Access to resources
Recommend
MATEC Web of conference, Vol. 157, Iss. issue, 2018-03 ,pp. :
Chemical analysis using X-ray and electron spectroscopies
By Esnouf C.
Revue de Métallurgie, Vol. 100, Iss. 5, 2010-03 ,pp. :
Access to resources
Soft X-ray spectroscopy of transition metal compounds: a theoretical perspective
EPJ Web of Conference, Vol. 132, Iss. issue, 2016-12 ,pp. :
Testing ion structure models with x-ray Thomson scattering
EPJ Web of Conference, Vol. 59, Iss. issue, 2013-11 ,pp. :