Publisher: IGI Global_journal
E-ISSN: 2156-1729|2|4|1-11
ISSN: 2156-1737
Source: International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE), Vol.2, Iss.4, 2012-10, pp. : 1-11
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Design of Low Noise L-Band Frequency Source
Advanced Materials Research, Vol. 2014, Iss. 1078, 2015-02 ,pp. :
Optical Characteristics of Erbium-Doped SiO2/PVA Electrospun Nanofibers
Advanced Materials Research, Vol. 2015, Iss. 1108, 2015-07 ,pp. :
The infra-red photoresponse of erbium-doped silicon nanocrystals
By Kenyon A.J. Bhamber S.S. Pitt C.W.
Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. :
Preparation and characterization of erbium-doped ormosil planar waveguides
By Xu J. Aubonnet S. Barry H.F. MacCraith B.D.
Materials Letters, Vol. 57, Iss. 26, 2003-09 ,pp. :