The analysis of hydrostatic pressure dependence of the Au/native oxide layer/n-GaAs/Au-Ge Schottky diode parameters

Author: Özdemir A.F.   Özsoy T.   Kansız Y.   Sancak M.   Kökce A.   Uçar N.   Aldemir D.A.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|60|1|10101-10101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.60, Iss.1, 2012-10, pp. : 10101-10101

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Abstract