Monitoring the removal of excited particles in He/Ar/H₂ low temperature afterglow plasma at 80–300 K*

E-ISSN： 1286-0050|75|2|24707-24707

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.75, Iss.2, 2016-08, pp. : 24707-24707

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