Role of height and contact interface of CNT microstructures on Si for high current field emission cathodes

Author： Navitski A.   Serbun P.   Müller G.   Joshi R.K.   Engstler J.   Schneider J.J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|59|1|11302-11302

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.59, Iss.1, 2012-08, pp. : 11302-11302

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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