The waveguide method for measuring parameters of the surface layers

Author: Danilenko S.S.   Osovitskii A.N.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|59|1|11301-11301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.59, Iss.1, 2012-07, pp. : 11301-11301

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Abstract