Extracting chemical information from single-wavelength X-ray reflectivity data

Author： Salah Fethi   Harzallah Besma   Mérian Thiphaine   Debarnot Dominique   Poncin-Epaillard Fabienne   van der Lee Arie  

Publisher： Edp Sciences

E-ISSN： 1286-0050|62|1|10304-10304

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.62, Iss.1, 2013-04, pp. : 10304-10304

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