Remote surface roughness effects on inversion electron density in nano-MOSFET

Author: Wang Z.-O.   Mao L.-F.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|48|2|20301-20301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.48, Iss.2, 2009-10, pp. : 20301-20301

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Abstract