Testing of flexible InGaZnO-based thin-film transistors under mechanical strain

Author： Münzenrieder N.S.   Cherenack K.H.   Tröster G.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|55|2|23904-23904

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.55, Iss.2, 2011-08, pp. : 23904-23904

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